Selecting Telecommunication Test Equipment To Maximize Throughput And Accuracy
By Robert Green, Keithley Instruments, Inc.
Soaring demand for cell phones, pagers, mobile radios, and basestations, is putting pressure on test engineers to shorten production test time. This may require selection of new test equipment that can improve throughput and accuracy in several areas, including a wide variety of DC and low-frequency board-level tests and battery testing or simulation.
SDR Advantages For Test Equipment
By Michael D. Millhaem, Keithley Instruments
Test equipment manufacturers have begun to implement instrument designs using software-defined radio (SDR) principles and devices. This article provides a brief overview of software-defined radio techniques, how SDR is implemented in test equipment and the advantages that test equipment manufacturers and customers realize from these designs...
LXI Clears The Way To Smarter Instruments
The trend toward more intelligent
instruments has become increasingly evident
as vendors of test and measurement
equipment take advantage of increased
processing power to expand the features and
functions their products provide. These
include advanced data analysis and reduction,
more sophisticated sequencing and control,
and built-in functions targeted at specific T&M
applications. This paper details how the
capabilities included in the LXI (LAN
eXtensions for Instrumentation) Standard
enhance and accelerate the trend toward
smarter instruments. It examines how the new
generation of LXI smart instruments will lower
the total cost of test while improving
performance, increasing flexibility, and
enhancing ease of use
Software-Defined Radio: The Next Wave In RF Test Instrumentation?
By Michael Millhaem, Keithley Instruments, Inc.
The communications market is challenging due to the rapid development of new standards, which often require new stimulus and measurement capabilities. To keep pace, test vendors must find new approaches that reduce instrument development times and allow instruments to adapt to new requirements. Software-defined radio is one technique that can help...
Understanding The Perils Of Spectrum Analyzer Power Averaging
The following article explores the issues associated with power averaging in order to help readers avoid making the same mistaken assumptions the author did. The conclusions presented here are the results of an experiment that involved correlating the power measurements of two spectrum analyzers from different vendors. However, the issues discussed are generic in the sense that they apply to any spectrum analyzer power measurement with some form of post-detection averaging
Statistical Process Control Of Wireless Device Manufacturing Requires Production Worthy S-Parameter Measurements
By Carl Scharrer, Keithley Instruments
Whether you are manufacturing RFICs for cell phone modules on III-V wafers or DSPs on a silicon-based technology, predicting final product performance and reliability requires S-parameter measurements at the wafer level to complement the DC data. This is only practical when calibration and deembedding of the S-parameters is automated, along with probe cleaning. The ideal case, as described in this article from Keithley Instruments, is to have a single test operation collect the DC and S-parameter data...
Keithley Launches 6½-Digit USB Digital Multimeter For Test Applications
Keithley Instruments, Inc. announces the release of the Model 2100 6½-Digit USB Digital Multimeter (DMM), a high precision, low-cost USB-based instrument
ESD Safety In Manufacturing And Data Tracking
Electrostatic discharge, more commonly known as ESD, appears in many forms. From lightning bolts to a near-invisible spark when touching a piece of metal, there is no single way to encapsulate all of the different forms of ESD. In many cases, ESD can be felt in the form of a mild shock, usually more irritating than painful. However, when it comes to the world of electronics and manufacturing, this little shock can prove costly. One of the primary challenges facing any manufacturer is tracking inventory and supplies without compromising ESD safety. Submitted by Microscan
Impinj CEO Dr. William T. Colleran Named Ernst & Young Entrepreneur Of The Year 2007 Award Finalist In The Pacific Northwest
Semiconductor and RFID technology provider Impinj, Inc. recently announced that CEO Dr. William T. Colleran is a finalist for the Ernst & Young Entrepreneur Of The Year 2007 Award in the Pacific Northwest region. According to Ernst & Young, the awards program was designed to recognize outstanding entrepreneurs on a regional, national and global level who are building and leading dynamic, growing businesses.
SUSS MicroTec AG Appoints New Chief Financial Officer
SUSS MicroTec has appointed Michael Knopp as the Group’s new Chief Financial Officer. He will join SUSS on August 1st 2007 and succeeds Stephan Schulak who left the company at the end of March