S600 Series Parametric Test Systems
Source: Keithley Instruments, Inc.
Keithley's Series S600 parametric testers are designed to help fabs and wafer foundries reduce their Cost of Test (COT). Ongoing changes in materials, design rules, and wafer size typically produce a semiconductor process "inflection" roughly every 18 months
Click Here To Download:
•Datasheet: S600 Series Parametric Test Systems
Keithley's Series S600 parametric testers are designed to help fabs and wafer foundries reduce their Cost of Test (COT). Ongoing changes in materials, design rules, and wafer size typically produce a semiconductor process "inflection" roughly every 18 months. These rapid changes mean one of the most significant contributors to a semiconductor manufacturer's COT is capital equipment reuse, rather than the initial equipment cost. That makes it critical to be able to upgrade a parametric test system cost-effectively to address new requirements. While most fabs typically expect 70-80% capital equipment reuse across multiple process generations, Keithley parametric testers have provided industry-leading capital equipment reuse over more than five technology inflections.
•Datasheet: S600 Series Parametric Test Systems
•Datasheet: S600 Series Parametric Test Systems
Keithley's Series S600 parametric testers are designed to help fabs and wafer foundries reduce their Cost of Test (COT). Ongoing changes in materials, design rules, and wafer size typically produce a semiconductor process "inflection" roughly every 18 months. These rapid changes mean one of the most significant contributors to a semiconductor manufacturer's COT is capital equipment reuse, rather than the initial equipment cost. That makes it critical to be able to upgrade a parametric test system cost-effectively to address new requirements. While most fabs typically expect 70-80% capital equipment reuse across multiple process generations, Keithley parametric testers have provided industry-leading capital equipment reuse over more than five technology inflections.
Key Features and Benefits:
- On-wafer DC to RF testing on a single platform
- Designed to minimize Cost of Test
- Wide range of applications covered
- SECS/GEM automation for 300mm and 200mm
Click Here To Download:
•Datasheet: S600 Series Parametric Test Systems
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