Datasheet | February 28, 2007

Datasheet: S600 Series Parametric Test Systems

Source: Keithley Instruments, Inc.
Keithley's Series S600 parametric testers are designed to help fabs and wafer foundries reduce their Cost of Test (COT). Ongoing changes in materials, design rules, and wafer size typically produce a semiconductor process "inflection" roughly every 18 months.
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