Model 4200 - SCS Semiconductor Characterization System
Source: Keithley Instruments, Inc.
The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage
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•Datasheet: Model 4200 - SCS Semiconductor Characterization System
The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.
•Datasheet: Model 4200 - SCS Semiconductor Characterization System
•Datasheet: Model 4200 - SCS Semiconductor Characterization System
The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.
Key Features and Benefits:
- Intuitive, point-and-click Windows®-based environment
- Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
- New pulse and pulse I-V capabilities for advanced semiconductor testing
- New scope card provides integrated scope and pulse measure functionality
- Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
- Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
- Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC-compliant sample tests
- Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
- Includes software drivers for Cascade Microtech Summit 12K Series, Karl Suss Model PA-200 and Model PA-300, Micromanipulator Model 8860, Signatone CM500 Prober, and manual probers
- Advanced semiconductor modeling support including Keithley supplied IC-CAP device modeling package driver and support for Cadence BSIM ProPlus/Virtuoso and Silvaco UTMOST device modeling tools
Click Here To Download:
•Datasheet: Model 4200 - SCS Semiconductor Characterization System
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