Datasheet | February 28, 2007

Datasheet: Model 4200 - SCS Semiconductor Characterization System

Source: Keithley Instruments, Inc.
The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage.
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