ZMD Standardizes On Verigy V93000 SOC Series For Wafer Sort And Final Test Of Mission-Critical Devices
"We have been using the V93000 for four years now, and as a result of that experience, we have tremendous confidence in Verigy solutions as well as in Verigy support," said Ralf Petzoldt, Test Manager at ZMD. "The V93000 is the only tester available that addresses our cost-of-test needs with parallel test at wafer sort. In reference to the ITRS(1), we achieve a mixed-signal wafer multi-site efficiency of 91 percent with the V93000."
"Quality and reliability are of paramount importance in the medical and automotive environments where mission-critical devices such as sensor signal conditioners are widely used," said Pascal Ronde, Vice President of Sales, Service and Support, Verigy. "The V93000 offers the specific capabilities that ZMD needs to confirm all of the required safety metrics for its devices. In addition, massively parallel test is required not only for the cost sensitivity of these markets but also to ensure ZMD's long-term return on investment in semiconductor test. The V93000 delivers on all scores."
About the Verigy V93000
The Verigy V93000 provides a scalable platform architecture for testing SoCs, systems-in-package (SIPs) and high-speed memory devices. The V93000, with more than 1,500 RF-ready systems installed worldwide, meets the industry's demanding performance and cost challenges, whether for at-speed engineering characterization or high-volume production. The test system provides low cost-of-test with massive multi-site capabilities, with data rates up to 12.8 Gbps and supports a full range of digital, mixed-signal, RF and wireless applications, such as cellular, WLAN, WiMAX, and UWB.
SOURCE: Verigy