Yield Management Software for LCD Fabrication

Knights Technology Inc software-based system for monitoring, analyzing and controlling defects during all phases of liquid-crystal-display manufacturing. LCD-YM collects defect data and images from the electrical tests and optical inspection of TFT (thin-film transistor) substrates and assembled panels, analyzes the information, and identifies manufacturing problems before they impact yield.

The deposition and photolithographic processes for fabricating the thin-film transistor arrays in LCDs are similar to those used in die fabrication but are applied to large, fragile glass sheets. Yield management systems are used for integrated-circuit production, which collect and analyze process data across the breadth of IC fabrication.

The yield-management system serves as the foundation of an automated process-control loop that integrates all LCD inspection, test, and fabrication equipment in a single plant or in multiple facilities. The system can automatically flag violations of SPC (statistical process control) limits and trigger corrective responses.

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