Product/Service

Wafer Measurement Services

Source: Hologenix
Optical Inspection for Polishing, Epitaxial, Wafer Bonding, and SOI Defects Surface and Bulk Metallic Contamination Wafer Geometry Subsurface and Surface Defect Mapping Resistivity Mapping
As a cost-effective alternative, especially for small and medium-sized businesses, we also offer all the measurements that our products can perform as in-house service. These measurements include: Optical Inspection for Polishing, Epitaxial, Wafer Bonding, and SOI Defects Surface and Bulk Metallic Contamination Wafer Geometry Subsurface and Surface Defect Mapping Contactless Resistivity Mapping You just have to send us your Wafers and we will do the work for you!