Wafer-Level RF Measurement Enabled By New WinCal XE Software From Cascade Microtech

Beaverton, OR - The proliferation of wireless consumer electronics devices with complex, multi-port RF architecture has pushed engineers to perform much more difficult and complex RF measurements on their wafer-level RF devices. To ease the process, Cascade Microtech has expanded the capability of its popular WinCal calibration software to include key features that will provide faster and more accurate wafer-level RF measurement.

Unique in the wafer test market, only WinCal XE combines advanced calibration with RF accuracy enhancement features. Through powerful new measurement support tools and guidance systems that minimize operator mistakes, WinCal XE enables accurate and reliable RF measurements, a real problem with today's complex semiconductor designs.

WinCal XE adds new features to the market's premier calibration software suite.

Key new features of the XE version include:

• Hybrid calibrations for multi-port measurements: Automated multi-port hybrid calibrations on up to four ports
• Local data manipulation for measurement validation and data analysis in the lab: Unlike other calibration software, now you can have advanced local data analysis, which allows early detection of questionable data prior to export
• Device characterization tools: Broad selection of powerful measurement-related tools that support device characterization Unique hybrid calibrations for four-port calibration

An increasingly common RF measurement challenge is the characterization of differential architectures requiring four measurement ports. Advanced two- port calibration methods, which are highly tolerant of probe placement uncertainty often experienced in wafer probing, are available today, but to date an advanced calibration method for four-port measurements has not been available. A further complication is that four-port system setup and calibration require many more steps than two-port system calibration, and thus has greater opportunity for error.

For the first time, WinCal XE provides new advanced hybrid calibration algorithms not available elsewhere. The hybrid calibration assures a precision "probing tolerant" calibration for four-port differential measurements. WinCal XE also simplifies four-port measurements by offering straightforward multi- port setup guides, management of multi-port calibration standards and vector network analyzer (VNA) ports, automatic calibration and validation of up to four ports.

WinCal XE offers the following advanced calibrations not available in any other commercial product:

• eLRRM cal for increased accuracy in routine calibrations
• Hybrid four-port calibrations, including SOLT-eLRRM and SOLT-SOLR for four-port accuracy
• Multi-line TRL to compare your preferred calibration methods to a NIST-style reference calibration

Advanced local data analysis

Powerful new tools allow users to convert measured s-parameters to a device-appropriate format. Users can view their data in whatever format they desire without undergoing the time-consuming process of exporting and converting results. This makes it easy to see effects or anomalies not readily seen in other display formats and provides a way to quickly validate the system setup and calibration prior to data export. The system also enables simple creation and sharing of display templates and development of custom libraries. With WinCal XE's advanced data processing, engineers get immediate, local data analysis and troubleshooting without ever having to leave their lab.

Device characterization tools

WinCal XE provides a broad variety of measurement-related tools that support device characterization. These include example reports and display templates that show how to apply available functions to a desired need. Users can modify included functions to build a library of the most frequently used functions. Many primitive functions are available. An error set manager provides error set augmentation and error set comparison tools, offering great flexibility in managing data quality.

SOURCE: Cascade Microtech, Inc.