TRIFT II High Performance TOF-SIMS
Source: Physical Electronics
The PHI TRIFT II is a high-performance TOF-SIMS designed for real-time problem solving...
The PHI TRIFT II is a high-performance TOF-SIMS designed for real-time problem solving. The design includes real-time secondary electron and ion imaging, single parameter tuning for insulators, and the automation of many data collection and data reduction tasks. The patented triple sector spectrometer provides unsurpassed mass resolution and sensitivity.
The TRIFT II has high-precision 50 mm, 200 mm, and 300 mm sample stage options for small sample and semiconductor wafer applications. Operating on Windows NT, the WinCadence™ software provides state-of-the-art instrument control, data acquisition and data reduction capabilities.
Physical Electronics, 6509 Flying Cloud Drive, Eden Prairie, MN 55344. Tel: 952-828-6100; Fax: 952-828-6322.