Teradyne Receives Five Star Rating From VLSI Research
North Reading, MA - Teradyne, Inc. announced VLSI Research, believed to be the world's leader in providing independent customer evaluations of semiconductor suppliers, named Teradyne a "Five Star Supplier" based on the 2006 Customer Satisfaction survey. Only 14 of the 100 companies qualifying for a star rating in the survey were designated as a "Five Star" company. According to the company, teradyne received its highest ratings in the Product Performance and Quality of Results categories of the VLSI Research 2006 survey. Teradyne also received high marks from customers in Technical Leadership.
"Our survey results reflect that Teradyne's FLEX Platform is resonating extremely well with the test needs of semiconductor manufacturers," said Risto Puhakka, President, VLSI Research Inc. "The platform is clearly delivering instrumentation for the broadest device test coverage and the OpenFLEX architecture answers the market requirement to allow third parties and customers to create customized test instrumentation. In the Quality of Results category, customers scored Teradyne with five stars, the highest star level in the survey. FLEX customers focus on multisite test efficiency, test capability and time to market, and based on our customer survey the FLEX is doing a great job of delivering in all of these areas."
Teradyne's FLEX Test Platform, which just surpassed its 1000th unit shipment, advances test technologies in an architecture designed for high-efficiency, multisite test. The Platform offers multiple systems so customers can optimize for performance, configuration capacity and capital cost to achieve lower cost-of-test. FLEX Platform systems span test requirements from (SOC) and System-In-Package (SIP) devices for consumer, automotive, mass storage, wireless, and data communications applications.
"Behind every test system purchase stands a global field organization dedicated to our customers," said Brad Nelson, Worldwide, Vice President, Sales, Teradyne. "Our Test Assistance Group (TAG) works with customers to quickly move new device programs into production and our Global Customer Service group continuously works with customers to improve Overall Equipment Effectiveness (OEE). We're pleased to receive such high marks from our customers in the VLSI Research Supplier Ratings and we look forward to providing each of our customers with a competitive advantage."
About The FLEX Test Platform
The FLEX Platform architecture delivers instrument synchronization and control in device clock time on a vector-by-vector basis, even in multiple time domains. A Universal Slot test head design allows easy reconfiguration for changing test needs. The IG-XL software operating system provides fast program development, including instant conversion from single to multisite test. And, the OpenFLEX open system architecture complements the FLEX Platform's broad set of high-density instrumentation, allowing focused instruments to be added and further enhance system performance and test economics. To learn more about the FLEX Platform, you can visit http://www.teradyne.com/flex/.
SOURCE: VLSI Research Inc