T5371 Flash Memory Test System
Source: Advantest America, Inc.
The T5371 is a 70 MHz test solution for flash and DRAM memory devices
The T5371 is a 70 MHz test solution for flash and DRAM memory devices. Offering lower cost and more test coverage, the T5371 is designed for both wafer probe applications with redundancy processing and flash logic intelligence. The at-speed fourth generation of Advantest's memory redundancy processor (MRA4) and added Flash redundancy features enable the T5371 to achieve new levels of wafer sort productivity.
With flash and DRAM devices now requiring double data rate capability and increased logic coverage for protocol logic, the T5371's Algorithmic Pattern Generator provides both NAND Palette Generation and full DDR capability to provide a one-pass, at-speed solution for flash probe and package production.
Advantest America, Inc., 3201 Scott Boulevard, Santa Clara, CA 95054-3008. Tel: 408-988-7700; Fax: 408-987-0691.
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