Software Application with Statistical Process Control
Source: ADE Corporation
WaferAnalyzer 2.2 with camLine SPC is a new software application designed to analyze production related defect problems and monitor process variations through advanced trend identification
ADE Corporationer 2.2 with camLine SPC is a new software application designed to analyze production related defect problems and monitor process variations through advanced trend identification.
The software performs rapid analysis of process defect issues and real time process control. With the ability to monitor production trends in areas that include line process control and inspection tool control, the software can analyze defect patterns while the SPC application features advanced setup for control charts and performs distribution analysis.
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