Small Stage DualBeam System
Source: FEI Company
The Strata DB 235 is a small stage DualBeam system for advanced Structural Diagnostics including semiconductor defect and materials characterization and process development
FEI CompanyDB 235 is a small stage DualBeam system for advanced Structural Diagnostics including semiconductor defect and materials characterization and process development. Featuring a 50mm stage, it is optimized for small samples, packaged parts and TEM samples.
The system offers automated TEM sample preparation for process control of shrinking device geometries and features Magnum ion column as standard equipment.
<%=company%>, 7452 NW Evergreen Parkway, Hillsboro, OR 97124-5830, Tel: 503-640-7500, Fax: 503-640-7509
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