Article | January 24, 2008

Article: Getting Started In Parallel Test -- Modification Of Existing Scribe Line TEGs

Source: Keithley Instruments, Inc.

By Randall G. Lee, Keithley Instruments, Inc.

Wafer-level parallel parametric testing involves concurrent execution of multiple tests on multiple scribe line test structures. This has the potential for huge improvements in throughput with existing test hardware.

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