SELA Navigation Software
SELA's new MC500 Navigation Software provides automatic navigation to a specific cleaving location for SEM and TEM sample preparation using defect coordinates and ID numbers from defect review and wafer inspection stations.
Microcleaving is a dry, two-step scribe and cleave procedure that capitalizes on the cleaving characteristics inherent in single crystal semiconductor substrates and achieves sub-micron sectioning accuracy through the targeted feature. Producing high quality cross-sections quickly significantly reduces the diagnostic cycle for both failure analysis and process monitoring. Using cryo-cooling, precise cleaving at specific locations is possible even in layers of softer materials such as the newer low-k dielectrics and Cu. The MC500 Microcleaving System provides fully automatic, reliable, and speedy cross-sectioning of both integral die and wafer level samples.
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