S-4700 Field Emission SEM

The S-4700 PC FESEM combines the versatility of PC control with a novel electron optical column to give exceptional performance on large specimens. Resolution of 1.5 nm at 15 kV is guaranteed at the EDX and specimen exchange position of 12 mm working distance! The S-4700 also offers excellent low kV performance with guaranteed resolution of 2.5 nm at 1 kV. Two versions, Type I and Type II are available, differing only in the specimen stages. The S-4700 Type II features a large movement motorised stage which will accommodate specimens up to 150 mm in diameter. Pre-programmed operating modes allows the user to switch from high resolution conditions to microanalysis conditions at the click of the mouse with no change of objective aperture. Key features include:

• 2.5 nm resolution at 1 kV and 2.5mm WD
• Cold finger and specimen exchange chamber as standard
• 1.5 nm resolution at 15 kV and 12 mm WD
• Optional fully integrated EDX system with 30o take-off angle
• Fully digital imaging, image processing and archiving system
• Twin SE detectors for versatile imaging

Hitachi Scientific Instruments, 755 Ravendale Dr., Mountain View, CA 94043. Tel: 800-227-8877; Fax: 650-961-0368.