S-3500N Variable Pressure SEM

The S-3500N has all the standard features of the S-3000N, but benefits from a chamber that can accept samples up to 8" in diameter, which also allows both EDX and WDX spectrometers to be fitted simultaneously. The EDX spectrometer can be fully integrated with Hi-Mouse option, which allows a single mouse and keyboard operate both the SEM and EDX system. The S-3500N has a high density frame memory of up to 2560 x 1920 pixels and an integral image processing, management and archiving system. An optional LaB6 electron source is available for even higher resolution performance. A unique low kV bias provides excellent image quality at accelerating voltages down to 0.3kV. This minimizes beam damages for all kinds of specimen of life sciences. Key features include:

• 3.5 nm resolution in high vacuum mode (3.0 nm with LaB₆)
• 5.0 nm resolution in variable pressure mode (4.5 nm with LaB₆)
• 1 - 270 Pa pressure range
• Scintillator backscattered detector
• Wide choice of specimen stages
• On-screen mouse control of brightness, contrast, focus and astigmatism as well as auto functions
• Low kV bias

Hitachi Scientific Instruments, 755 Ravendale Dr., Mountain View, CA 94043. Tel: 800-227-8877; Fax: 650-961-0368.