S-3000N Variable Pressure SEM

The S-3000N offers an ideal introduction to variable pressure scanning electron microscopy. It has impressive resolution figures of 3.5 nm at 25 kV in high vacuum mode and 5.5 nm at 25 kV in variable pressure mode. An automatic pressure monitoring and control system ensures that the correct vacuum level is maintained if specimens outgas. A unique low kV bias provides excellent image quality at accelerating voltages down to 0.3kV. This minimizes beam damages for all kinds of specimen of life sciences. Key features include:

• 1 - 270 Pa pressure range
• Solid state backscattered detector
• Chamber accommodates 6" samples
• Optional EDX microanalysis system with a take-off angle of 35°
• Frame memory of up to 1280 x 960 pixels
• Wide range of optional accessories
• Low kV bias

  Hitachi Scientific Instruments, 755 Ravendale Dr., Mountain View, CA 94043. Tel: 800-227-8877; Fax: 650-961-0368.