RAM Test System

Featured at Semicon West

Teradyne is demonstrating its advanced technology for testing high-bandwidth RAMs at Semicon West. The ARIES RAM test platform, which operates at data rates to 1.0 Gbit/second while testing up to 16 devices in parallel, tests the newest-generation devices such as Direct Rambus DRAMs, SLDRAMs, and fast SSRAMs.

Manufacturers require the lowest cost per bit in order to win in the competitive memory marketplace. ARIES enables memory manufacturers to achieve the lowest cost to test in several ways:

• Low Production Test Costs: By providing a test solution that includes single-pass high-speed testing with high parallelism and throughput, ARIES enables manufacturer to realize the lowest possible cost to test. ARIES tests up to 16 devices in parallel at Gbit/second data rates; its Pin Slice architecture delivers fast DC testing and lowest test-time overhead.

• Fast Ramp-up to Volume Production: ARIES' software, full integration of handling equipment, and compatibility among test systems across the production floor speeds a manufacturer's ramp-up to volume production.

• Shortest time to Maximum Yield: ARIES provides algorithmic testing at speed, a powerful suite of silicon debug tools, and the RA/Plus redundancy analyzer, which finds every repairable die, to deliver the highest possible yields in the shortest time. ARIES' 1 Gbit Catch RAM and Data Searcher compression hardware provide fast fail capture for redundancy repair analysis, silicon debug, and yield improvement engineering. Because ARIES' debug and characterization tools are fully integrated with its parallel operating software, memory manufacturers can perform fast data capture and analysis in parallel, reducing the time required to achieve maximum yields.

Teradyne, Inc., 30801 Agoura Rd., Agoura Hills, CA 91301. Contacts: Sue Hudson, Tel 805-522-3127; Fax 805-522-6630 and Elaine Bennett-Mike, Tel: 818-874-7310; Fax: 818-735-5623