Production Workcell Test Solutions

Featured at Semicon West 98

Credence Systems Corp., a manufacturer of automatic test equipment (ATE) for the semiconductor industry, has introduced Triton Logic and Triton Memory, a suite of workcell wafer test solutions featuring a wafer prober integrated with a robust ATE system. A workcell enhances manufacturing productivity by synthesizing previously separate equipment into a single, highly efficient tool.

A key differentiator for the Triton series is its use--in both systems--of the same mechanical interface (I/F). Triton workcells boost efficiency rates within a minimum footprint, and enable test of memory or logic devices with the same equipment methodology. The complete wafer probing workcell is used in volume production environments for microcontrollers and other cost sensitive devices with heavy logic demands.

Triton Logic, a tester integrated into an 8-in. wafer prober, features a bottom probe card changer assembly allowing reliable loading in less than 45 seconds. Triton Logic centralizes all operator functions and eliminates the unnecessary duplication of manipulators, monitors and keypads previously associated with separate testers and probers.

A 100 MHz final test at probe (FTAP) test system, the integrated Triton is capable of performance test at the wafer level for microcontroller, microperipheral, ASIC, FPGA, and PLD devices. Triton Logic provides test solutions for microcode analysis, analog-to-digital converters, and the high voltage requirements for on-chip functions such as memory programming and enabling of test modes. With the ability to be configured for up to 304 signal pins, Triton Logic has a 4 Meg pattern memory, a 128 Meg serial scan memory test, and mixed-signal test capabilities.

Triton Memory tests up to 16 sites in parallel at speeds of 50 MHz. All functions required to test flash memory devices appear on one card. An inherently parallel, high-performance system, Triton Memory tests each device asynchronously while embedded within an 8" wafer prober. Latched to the wafer prober's frame, the tester is now an integral part of the prober's structure, eliminating independent vibrations associated with current I/F concepts.

Triton Memory is an integrated solution ready to be plugged into virtually any world class production environment. Using the cost of productivity as its metric, the Triton series of products provides a solution for the operational needs of high volume production facilities.

Credence Systems Corporation, 215 Fourier Avenue, Fremont, CA 94539. Fax: 510-623-2523.