PCAM 100 & PCAM 200
A selection of one probe gripper is supplied with each machine. The Z-Grip-1 is intended for use with Z adjustable probes. The B-Grip-1 is intended for use with blade probes (either Metal or Ceramic blades) and is typically used with smaller blade profiles for wafer probing. Another blade gripper B-Grip-2 (not shown) is intended for use with larger blade probes that are typically used in Hybrid circuit applications. Please specify which probe gripper is desired when ordering the PCAM.
The PCAM-100 is a general-purpose machine intended for all standard probe cards up to 6.5 inches in width including standard rectangular and round probe cards. For rectangular probe cards, the PCAM-100 will accommodate both standard (S, M, L, XL, XXL) and non-standard centers of rotation.
The PCAM-200 is a large format Probe Card Assembly Machine and is intended to be used with larger probe cards up to 12 inches in size. In addition to all of the features of the PCAM-100, the model 200 offers a large vacuum chuck for larger devices and a greater range of motion for the probe manipulator mechanism.
The PCAM-200 also has a probe exerciser the provides predetermined probe deflection to relieve any mechanical stresses that might affect probe position and planarization. In addition, the exerciser can be used in conjunction with Resistox to abrasively clean the probe tips.
Both probe card assembly machines offer coarse and fine micrometer motion of all controls associated with the probe manipulator stage. The microscope mound and slide mechanism is unique and incorporates a recirculating ball bushing to provide complete movement over the surface of the probe card. This range of motion permits visual inspection not only of the probe contact array but also the entire surface of the card.
Accuprobe, Inc, 1 Harrison Avenue, P.O. Box 1044, Salem, MA 10970. Tel: 978-745-7878; Fax: 978-745-7922.