Negevtech Receives Repeat Order For New 3300 Wafer Inspection System

Rehovot, Israel - Negevtech, a privately held semiconductor equipment company specializing in wafer inspection solutions, recently announced that Micron, one of the world's leading providers of advanced semiconductor solutions, has purchased an additional 3300 wafer inspection system to inspect advanced Flash and DRAM devices at Micron's R&D fab in Boise, Idaho.

After an on-site evaluation, the 3300 has proven to be a competitive inspection tool for next generation memory devices, consistently delivering a compelling combination of high sensitivity and high throughput results across the entire process flow. In addition to 3 to 4 times improvement in throughput compared to the previous generation Negevtech system, the 3300 offers industry-leading sensitivity on memory devices.

"We are happy that Micron has selected our 3300 wafer inspection system to support the leading edge Flash and DRAM development efforts underway in the R&D Fab," said Dr. Rivi Sherman, President and CEO of Negevtech. "We continue to invest in our core R&D to develop innovative inspection solutions and drive down the overall cost of ownership for our customers."

About the Negevtech 3300 Wafer Inspection System
The 3300 is Negevtech's 3rd generation wafer inspection system incorporating the company's Patented Step&Image Image Acquisition Technology. The 3300 entered beta late in 2007 and is now available for general release in two configurations, 3370 and 3320.

SOURCE: Negevtech, Inc.