Memory Test System
Source: MOSAID Systems Incorporated
The MS4155 Memory Test System is a fourth-generation test system designed to test and analyze PC133, single (SDR) and double data rate (DDR) SDRAM memory devices
MOSAID Systems IncorporatedMemory Test System is a fourth-generation test system designed to test and analyze PC133, single (SDR) and double data rate (DDR) SDRAM memory devices in a highly interactive and engineering-friendly software environment. The system performs characterization and design verification as well as product engineering, failure analysis, quality assurance and yield enhancement testing tasks.
<%=company%>, 3375 Scott Blvd.,Ste. 206, Santa Clara, CA 95054. Tel: 408-727-7199. Fax: 408-727-0479.
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