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INTEGRA J750 CMF Test System

Source: Samsung Kwangjun Co., Ltd.
Samsung Semiconductor has completed development of the world's first Rambus In-line Memory Module (RIMM), which facilitates
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INTEGRA Test Division introduced the INTEGRA J750 CMF Test System. The INTEGRA J750 CMF is a specially configured test system for the fabless and subcon market. Fabless semiconductor and subcon customers can take advantage of the INTEGRA J750's 100 MHz digital performance and 1,024 digital pins. Teradyne has already shipped several systems to fabless semiconductor companies and will ship additional systems to subcontractors in Q3 1998.

The INTEGRA J750 is a highly-integrated series of test systems designed for testing devices in the low-end and mid-range VLSI markets such as; FPGAs, PLDs, microcontrollers, and digital audio/video devices. It delivers up to 1,024 digital channels into a zero footprint system entirely contained within a test head. The system provides a full 64 channels of a VLSI test system performance onto a single printed circuit board. The INTEGRA J750 also features IG-XL test software, the ATE industry's first component based software environment. The IG-XL test software integrates industry standard software components and tools such as WINDOWS NT, Microsoft Excel, and Visual Basic. Finally, the INTEGRA J750 utilizes Optisite Parallel Test technology to deliver up to 32 sites in parallel at 95% efficiency.

Teradyne Inc., Contact: Samantha Sullivan, 781-275-1817.