Infrared Microscope
Source: Besi Die Handling
Model FF-1 has infrared sensitivity that extends beyond 1.15 microns with a maximum at approximately 0.9 micron
Besi Die HandlingFF-1 has infrared sensitivity that extends beyond 1.15 microns with a maximum at approximately 0.9 micron. The short wavelength cutoff is determined by microscope filters at 7500 Angstroms. This instrument is available with an infrared video to 1.8 microns, optional to 2.2 microns. It is suitable for infrared transmission imaging. This product also features a calibrated mechanical stage with concentric drop-down controls 50 mm x 75 mm motion. Oversize, wafer carrier, or long working stages are also available.
<%=company%>, 121 Ethel Road West, Piscataway, NJ 08854. Tel: 732-572-4800. Fax: 732-572-4808.