Image Sensor Test System
The IP750 is a new generation image sensor test system based on the company's J750 VLSI test system, which has the 100MHz digital tester capability, and added a hardware and software architecture that answer the needs for testing CCD/CMOS image sensor devices, which requires complex functional testing.
The system incorporates the Windows NT based IG-XL as the test development environment. The system features the Integrated Parallel (IP) architecture, where complete parallel processing features are built in several different architecture levels, in both hardware and software. The IP architecture includes the DSP (Digital Signal Processing) functions of image data, which runs on the PC under multi-processor, multi-threaded program execution environment.
The system is a highly integrated tester, which puts power of a complete 100MHz digital tester and image sensor tester into the same space previously required for just the test head. The zero-footprint design allows for maximum use of the test floor space.
<%=company%>, 321 Harrison Ave, Boston, MA 02118. Tel: 617-4822700; Fax: 617-422-2910.