Product/Service

High Speed Test Probes

Source: Rika Denshi America, Inc.
High Speed Test Probes are designed to perform high cycle, high reliability IC testing and have operating lengths as short as 2.5mm (.098in) to assure <1 nH self inductance
Rika Denshi America, Inc.Test Probes are designed to perform high cycle, high reliability IC testing and have operating lengths as short as 2.5mm (.098in) to assure <1 nH self inductance. Featuring bandwidths up to 7 GHz, they are available for testing devices with centerlines as small as 0.5mm.

Providing robust construction and uniform contact pressure, the Probes come in a variety of tip styles to accommodate different analog and digital devices that require testing. Operating lengths can be customized to meet z-tolerance requirements.

<%=company%>, 112 Frank Mossberg Drive, Attleboro, MA 02703, Tel: (508) 226-2080, Fax: (508) 226-2980