High-Speed Memory Test System

The new T5585 Memory Test System is designed for high-volume package production of memory such as DDR-SDRAM and SSRAM, with high precision testing of up to 128 devices in parallel.

Capable of testing 500 MHz Double Data Rate (DDR) in a single pass, the system also incorporates the latest technology in accuracy, stability, and reliability.

By doubling the test-cell capacity of the T5581, which is the company's record-setting production tester, the T5585 joins production efficiency with next-generation performance for high-volume memory test.

The unique capabilities of the system permit at-speed testing of high-speed memories, demand for which is expected to increase sharply.

Performance Architecture Delivers Advanced Capabilities
The system has both per pin timing and an enhanced strobe shifting feature to address Data Strobes and Echo Clock functions of DDR devices. In addition, the company's proprietary immersion cooling system stabilizes the test head resources, improves reliability and contributes to the system's compact footprint, which is notable given the system's advanced capabilities.

High-function Test and Family Compatibility, Too
The system is software compatible with Advantest's existing memory platforms- both the T5300 Series and the T5500 Series- maximizing customers' investments in existing programs and enhancing ease of use on the production floor. It also cuts program development time.

Installed software and various debug tools have contributed to cutting turnaround time (T.A.T.) as well.

Advantest America, 3201 Scott Blvd., Santa Clara, CA 95054. Tel: 408-988-7700. Fax: 408-987-0691.