Product/Service

Handler for High-Speed Memory Production

Source: Advantest America, Inc.
The M6541A Dynamic Test Handler is targeted for production of high-speed memory devices to the North American market.
The M6541A Dynamic Test Handler is targeted for production of high-speed memory devices to the North American market.

The companion to the company's new T5585 250/500 MHz Memory Test System, the M6541A is targeted to the next-generation DDR SDRAM/SSRAM market. Designed with a unique four-step handling function that keeps index time to a minimum, the system can handle simultaneous testing of up to 64 devices- 6,000 devices per hour- maximizing throughput and helping to reduce test costs. Two handlers can be connected to the T5585, which performs high-precision testing of up to 128 devices in parallel at 250 or 500 MHz.

Easy Operation Today While Meeting Factory Needs of Tomorrow
The M6541A's touch panel and comprehensive help function make it extremely easy to operate. In addition, the system was designed so that the time needed for establishing operating requirements and correcting problems are significantly reduced.

Designed for long-term system investment, the handler is also optimized for state-of-the-art factories, well into the 21st century, with two special functions:

  • A maintenance function that alerts the operator when parts need changing. It also keeps a record of replacements, adjustments, and cleaning.
  • Optional SECS function which allows for the inter-equipment communication necessary for factory automation and gathering of operation data.

In addition to these functions aimed at automated factories, the handler has a wide range of other functions, geared to reducing test costs, including:

  • Automatic Inspection
  • Optional Tray Mapping
  • Optional Second Testing Station
  • Socket Correlations Sequence

Advantest America, 3201 Scott Blvd., Santa Clara, CA 95054. Tel: 408-988-7700. Fax: 408-987-0691.