FilmTek 2000
Source: Scientific Computing International
FilmTek 2000 system provides peak measurement performance from very-thin to very-thick films (up to 150)
FilmTek 2000 system provides peak measurement performance from very-thin to very-thick films (up to 150). It's achieved by high wavelength resolution detector combined with low cone angle optical design and apertures to limit measurement spot size. Depending on the films involved, FilmTek 2000 system can characterize multi-layer film stacks. And our proprietary dispersion model covers a wide spectral range from 190 to 1700 nm.
Scientific Computing International, 910 Monte Mira Drive, Encinitas, CA 92024. Tel: 760-634-3822; Fax: 760-634-3826.