Elma Offers SerDes Test Modules For VPX Systems

Fremont, CA - Elma Electronic Inc., a global manufacturer of electronic packaging products, has announced new SerDes Test Modules for VPX systems. The modules are being offered in partnership with DFT Microsystems, a leader in high-density test solutions for high-speed semiconductor device interfaces.

With architectures moving to higher speed Serial RapidIO, Infiniband, PCI Express, Gigabit Ethernet, and other serial fabrics, it is increasingly important to measure the signal performance of the system. The SerDes modules are designed to plug into VPX backplanes and directly test the channel compliance. They can be used to test VPX switch and node cards and/or the backplane channels without requiring external equipment or special test fixtures.

Many Time Domain Reflectometers (TDRs) and Oscilloscopes in labs today cannot handle the massive density of high-speed serial signals used in architectures like VPX. Plugging directly into the backplane/chassis, the modules allow quick and easy characterization of the signals and eliminate the need for SMA connectors, cables, and capital-intensive measurement hardware. With a USB connection to a laptop or desktop computer, it is easy to create Eye Diagrams, measure Bit Error Rates (BER) and jitter, and more. Plus, the module kit includes software with a simple GUI interface. Within minutes, the user can plug the cards into the test chassis, connect the USB cable to a laptop, download the GUI software and begin measurements.

The first in the test module series is an 8-channel version for 6U cards. With a scalable design, configurations in 4-channel, 12-channel, or 16-channel are available upon request. Elma also offers an E-frame VPX test chassis with dedicated cooling and power options for VPX. The chassis is offered separately, but can be purchased together with the SerDes test cards.

The SerDes test technology that is deployed in the VPX Test Modules is modular and can be affixed to various form factor carrier boards. So, the modules can be designed for other architectures. A MicroTCA test card for AMCs is planned to be release in the summer of 2008.

SOURCE: Elma Electronic Inc.