Electron Backscatter Diffraction

Orientation Imaging Microscopy provides microtexture mapping, grain boundary profiles, multiphase mapping and statistical analysis of polycrystalline samples, including semiconductors, superconductors, ceramics, metals, minerals, rocks and composites.

Orientation / Grain Boundary Mapping

OIM maps link local lattice orientation with grain morphology, providing the materials scientist with visual cues for interrogating the orientation relationships in a microstructure. OIM allows the features in these maps to be defined precisely, giving the materials scientist a powerful tool for quantifying the orientation-dependent characteristics of a microstructure.

Texture Analysis

Like other texture measurement techniques, OIM measurements can be used to determine the degree of preferred orientation or texture in a polycrystal. However, since OIM analysis provides spatially specific measurements, OIM enables the distribution of grain boundary misorientations to be characterized.

Integrated EBSD/EDS Mapping

OIM can be fully integrated with EDAX EDS systems as a Pegasus. The Pegasus products provide time savings and added analytical features by allowing the user to incorporate his chemical analysis with local crystallographic features.

Applications

• Microtexture Analysis
• Multiphase Analysis
• Stress Corrosion Cracking
• MTF of Interconnect Lines
• Grain Growth
• Qualitative Strain Mapping
• Recrystallization

EDAX, Inc., 85 Mckee Dr., Mahwah, NJ 07430. Tel: 201-529-4880; Fax: 201-529-3156.