EG4/200 Prober
Source: Electroglas, Inc.
The EG4/200 Prober addresses wafer probing needs for System-On-Chip (SOC) devices requiring a very high Z-force and low deflection, low-compliance wafer chuck.
The EG4/200 Prober addresses wafer probing needs for System-On-Chip (SOC) devices requiring a very high Z-force and low deflection, low-compliance wafer chuck. Industry trends such as bumped wafers, parallel die testing and high pin count applications are driving a new set of wafer probing requirements. The prober meets these requirements with its probe-centered z-drive, offering high probing force and low chuck deflection.
Features and Benefits
- Probe-centered z-drive and low deflection
- Large, removable scrub block and brush
- PC Vision
- Larger Monitor
- 4090 Family Compatibility
- Directed Probing with QuickSilver Inspection System Data
Electroglas, Inc., 2901 Coronado Dr., Santa Clara, CA 95054. Tel: 408-727-6500. Fax: 408-982-8055.
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