Credence To Exhibit Sapphire D-10 High-Production Solution For Testing Cost Sensitive Devices
To meet the demand of high-growth and low cost market segments in the China region, Credence will showcase its Sapphire D-10, the newest member of the Sapphire ATE platform. The Sapphire D-10 is an innovative, high- throughput, multi-purpose wafer sort and final test solution, specifically designed to address the economic requirements of the microcontroller, wireless baseband, display driver controllers and low cost consumer mixed-signal device markets. Optimized for the 200 Mbps probe market and designed to support massive multi-site production, the Sapphire D-10 is perfectly suited to support the rapid development of China's semiconductor industry.
"With sales volume of China's electronic information products manufacturing sector totaling US$320.3B last year alone(1), China has become one of the world's largest producers of electronic information devices," said Dave Ranhoff, president and chief executive officer of Credence Systems Corporation. "Actively participating and supporting conferences and venues such as IC China is just one example of our commitment to our customers in the local region."
In addition to the Sapphire D-10 system, Credence will also highlight its test solutions for the non-volatile memory and automotive industries as well as present three technical papers -- "Flash Memory Complexity," "Economic Solutions for Testing Automotive Devices," and "Test Economics Optimized with a Truly Modular, High-Throughput Test Architecture." Credence will showcase its solutions at Booth #B-10 at IC China, held at the Beijing Haidian Exhibition Hall in Beijing, China.
SOURCE: Credence Systems Corporation