Configuration of High Pin Count ValStar Series

Featured at Semicon West

Credence Systems Corp. introduces the VS 2000e test system. An optional configuration of Credence's high pin count ValStar Series' VS 2000 test system, the VS 2000e will be unveiled at Semicon West 98 in the San Jose Convention Center on July 15-17 (Booth No. 11927). The VS 2000e is designed to increase productivity and reduce operating costs. With its small size and flexible production interface, the VS 2000e allows manufacturers and assemblers to customize the configuration to suit their production requirements. Easily configured as an integrated solution for high-volume production facilities, the VS 2000e significantly improves operation efficiency and test floor productivity.

The tight integration of the VS 2000e to the prober or handler dramatically reduces the test system floor space to less than 3 m². This new configuration also delivers greater flexibility for test cell layout and optimization of available space. These factors are critical for high-volume facilities requiring utmost efficiency and factory productivity. The VS 2000e matches all of the capabilities of the VS 2000 for testing of complex logic, embedded memory, and embedded analog prevalent in today's most sophisticated high pin count VLSI chips. Specific applications include microprocessors, controllers, advanced chip sets, ASICs, and FPGAs. Credence's use of low-power stabilized CMOS technology packs the full 1024 I/O pins and data rates of 200 MHz into less than 3 m² and consumes less than 16 kW of power. Combining 3 Gigabit Scan memory and a unique high speed Iddq measurement feature, the VS 2000e enables multisite testing of up to 16 devices in parallel to maximize production throughput of the most complex devices.

Credence Systems Corp., 215 Fourier Ave., Fremont, CA 94539. Tel: 510-657-7400