Bede QC200 X-ray Diffractometer
200mm (8 inch mapping capability)
Ergonomic cabinet design with a large opening top for easy sample handling
Advanced Microsource X-ray generator (80W) included as standard
May be upgraded with Reflex Micromirror to give >1Mcps sample peak intensities
Micromirror option provides sub-mm X-ray beam, ideal for analysis of processed device wafers
Horizontal specimen mounting
Large X-ray safe viewing window
Reliable and simple to use Versatile Windows-based Bede Control software
Fully compatible with Bede Lab software, including RADS Mercury auto-fitting software
Optional TV alignment system for exact positioning of samples
Applications
Techniques
- High resolution X-ray rocking curves
- Symmetric, asymmetric and quasi-forbidden 002 reflection capability
- Area uniformity plots
- Layer relaxation, tilt & thickness determination
- Substrate perfection and offcut measurements
Bede Scientific Incorporated, Suite G-104, 14 Inverness Drive East, Englewood, CO 80112. Tel: 303-790-8647; Fax: 303-790-8648.