Barth Model 45001WP TLP Wafer Probe
The Barth TLP Wafer Probe has been specially designed to provide the same accuracy as when testing packaged devices in a socket. Testing the TLP characteristics of the device on wafer, and later when it is packaged, can provide significantly more information than is available with pass or fail testing with human body model or machine model. Either manner of connecting to the DUT allows very repeatable measurements at high pulse currents.
To minimize the mechanical problems of crossed needles in connecting to the pads to be tested, a specially designed constant impedance-reversing switch allows easy selection of the TLP pulse polarity at the pads. A strong magnetic base allows this TLP probe to be easily moved while maintaining a secure position on the table.
A controlled 50-ohm impedance throughout the complete measurement chain of our test system minimizes the measurement errors associated with the usual 500-ohm resistor connections for ordinary TLP testers. Making measurements at 50-ohm impedance minimizes the effects of parasitics.
The Barth TLP Wafer Probe has a controlled 50-ohm impedance throughout its connections to the two needle contacts at any two pads.
Testing the DUT directly from an inherently low 50-ohm source impedance provides inherently higher pulse currents from a clean test pulse with no ringing or overshoot. A perfect sub-nanosecond risetime pulse generator combined with low distortion measurements and controlled impedance connections allows the Barth TLP Test System to make accurate comparisons between the TLP characteristics on wafer and in packages.
Barth Electronics Inc., 1300 Wyoming St., Boulder City, NV 89005-2718. Tel: 702-293-1576; Fax: 702-293-7024.