ASSET® ScanWorks® JTAG System Integrated Into New Agilent Medalist i5000 In-Circuit Test Platform
New Medalist ScanWorks bundle delivers cost-effective test re-use from development to high-volume manufacturing
Richardson, TX – ScanWorks, a JTAG test system from ASSET InterTech Inc. (www.asset-intertech.com), an international leader in boundary-scan (IEEE 1149.1/JTAG) test and in-system programming (ISP), has been integrated seamlessly into Agilent Technologies' new next-generation in-circuit test (ICT) system, the Medalist i5000. In addition, Agilent features ScanWorks as the premier JTAG bundled solution on its Medalist ICT product line, including the i5000 and 3070 Series systems. Agilent now refers to its boundary-scan solution as Medalist ScanWorks.
"When we partnered with ASSET and integrated their ScanWorks tools into our 3070 product more than three years ago, we were making a commitment to bring the "best-in-class" boundary-scan solution to our customers," said Marty Leeke, an Agilent ICT product manager. "Our commitment continues with the i5000. In Medalist ScanWorks, users of any Agilent ICT systems have a JTAG system that is truly powerful in terms of its test coverage and speed of test application for high-volume manufacturing operations. At the same time, it's very easy to learn and use."
ScanWorks is currently used by leading electronics companies such as Cisco, Lucent Technologies, Agilent, BAE, Alcatel, Hewlett-Packard, Ericsson, Intel, Raytheon, SBS, Solectron, Rockwell Collins, EMC and others.
"By continuing the integration of ScanWorks with its ICT systems, Agilent is able to offer its ICT users the efficiency of re-using boundary-scan tests across the entire life cycle of a product," said Alan Sguigna, ASSET's vice president of sales and marketing. "JTAG design validation tests generated on a ScanWorks benchtop station during a product's development phase can be re-used in high-volume manufacturing on ICT systems with Medalist ScanWorks. And later, these same boundary-scan tests can migrate to field service and repair operations, reducing the cost of test development and increasing overall productivity. All Medalist ScanWorks tests are fully compatible with both the i5000 and the 3070 platforms."
The Medalist ScanWorks solution bundles ScanWorks with Agilent's Interconnect Plus boundary-scan tool and Silicon Nails, which works with boundary-scan chains to automatically test non-boundary-scan devices. Users can migrate tests from a ScanWorks station in their design departments to manufacturing, where the tests can be merged with Silicon Nails tests, for example. This coordinated test suite can then be applied on an Agilent Medalist ICT system. A test suite containing both ScanWorks and Silicon Nails tests will achieve higher test coverage than either test type could on its own.
About ASSET InterTech
ASSET InterTech, Inc. develops, markets, sells, and supports boundary-scan testability and in-system programming (ISP) products worldwide. ASSET's affordable ScanWorks® environment is easy yet powerful. It allows users to quickly and easily test semiconductors, circuit boards or entire systems during every phase of a product's life, including design, manufacturing/repair and field maintenance. The ISP capabilities of ScanWorks can be used to load software or data into programmable devices after they have been connected to a printed circuit board. The ScanWorks product family works in conjunction with a standard of the International Electronics and Electrical Engineering (IEEE) society known as the IEEE 1149.1 (JTAG) boundary-scan test specification. ASSET InterTech is located outside of Dallas, TX, at 2201 North Central Expressway, Suite 105, Richardson, TX 75080. For product information, call toll free 888-694-6250, send faxes to 972-437-2826, direct e-mail to sales@asset-intertech.com or visit the company's Web site at www.asset-intertech.com.