Aehr Receives Order For ABTS From Integrated Service Technology In Taiwan

Fremont, CA - Aehr Test Systems recently announced it has received the first order for the Company's new Advanced Burn-in and Test System (ABTS) from Integrated Service Technology (iST) in Taiwan. The system is configured for burning-in and testing advanced logic devices. This follows a thorough evaluation of a demonstration system delivered to iST in May of this year.

"This ABTS system is the first in a series of new products that will be introduced over the next several quarters for testing packaged devices. This new technology is based on our successful FOX(TM)-1 full-wafer contact burn-in and test system," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems. "Although numerous FOX(TM) systems are currently in high volume production in many parts of the world, this is the first version of the ABTS package part TDBI systems based on the same electronics. Other members of the ABTS family will focus on high-power logic and memory devices."

"We are committed to providing the most competitive solutions to our customers, and ABTS is a powerful extension of that commitment," said Christine Lee, Manager of Corporate Communication & Industrial Competitiveness Planning Division of Integrated Service Technology. "By working with Aehr, we are able to achieve the highest level of customer satisfaction."

"We understand the needs customers have for burning-in and testing advanced logic devices," commented Rick Wu, VP of Integrated Engineering Service Division of Integrated Service Technology. "Therefore, we dedicate our knowledge and service expertise to help customers successfully compete in their market space."

The ABTS family of products is based on a completely new hardware and software architecture that addresses not only today's devices, but also future devices for many years to come. The system can test and burn-in memory devices as well as both high- and low-power logic devices. The ABTS system can be configured to provide individual device temperature control for devices up to 75W or more and with up to 320 I/O channels. It uses N+1 redundancy technology for many key components in the system to provide the highest possible system uptime.

SOURCE: Aehr Test Systems