Advantest's T6682 High-Speed VLSI Test System for Advanced Devices

The T6600 Logic Test Family consists of the T6682 and the T6672. These systems are highly compatible both hardware (test fixture, docking interfaces) and software (test programs, user features).

T6682 is intended to provide very high speed performance for testing devices that use new interface technology, such as RAMBUS, Fire Wire, SONET, at rated speeds. The T6682 supports functional test of devices with clock frequency to 1.6GHz, and data rates to 1Gbps. Since testing of devices at these speed rates is not practical today at wafer probe, it would be performed at final, packaged part test.

The T6682 is designed for high speed functional test, with each pin channel providing a MULTi-pin capability. Each tester channel provides a separate data drive and data compare connection. This allows device IO pins to be connected in a Fly-By manner using a single tester channel.

This separate I and O connection also allows the T6682 to address devices with pin counts of greater than 1024 pins! In this mode, the T6682 could provide 1024 IO and 1024 O channels. Thus, the T6682 could double as an extremely high pin count probe or final test system.

Advantest America, Inc., 3201 Scott Boulevard, Santa Clara, CA 95054-3008. Tel: 408-988-7700; Fax: 408-987-0691.