Standard Sample For Height Calibration

It is well known that the step structure on silicon surfaces can be controlled by a heating process in an ultrahigh vacuum. The height of the Si(111) monoatomic step is 0.31 nm and is determined crystallographically. Anyone can use this standard sample to calibrate the height scale of an AFM instrument or estimate the instrument's performance. A 10mm × 10mm sample can be applied to any AFM instrument. The sample is carefully packaged for delivery to prevent it from coming into contact with anything. With appropriate precautions to guard against humidity and floating particles in the air, the surface structure is good for more than 6 months.