Advantest Introduces 266MHz T5782 Memory Test System For MCP/Flash Devices And Memory-Embedded Microcontrollers

Tokyo - Advantest Corporation, the world's leading supplier of semiconductor test equipment, recently announced its new memory tester, the T5782. Available this month, the T5782 is designed with per-site architecture and industry-leading speeds of 266MHz/533Mbps, and is ideally suited for testing today's flash memories, as well as future device generations including memory-embedded microcontrollers and rapidly evolving memory bus environments. The T5782's at-speed, at-specification performance meets the requirements of tomorrow's Known Good Die (KGD) and MCP memory solutions.

The system boasts an ability to simultaneously test up to 256 devices and inherits the advanced technologies and performance features of its predecessor, the T5781, with a footprint half the size. The T5782 also incorporates many flash functions including ECC and Block Management, which enable the system to flexibly address diversified needs,

Diversification of Flash Microcontrollers Drives Demand for Flexible High-Speed Test

From refrigerators and washing-machines, to cellular phones, gaming, HDTV and cars, consumer products now incorporate an unprecedented amount of advanced technologies. Embedded flash-memory-based MCUs are dominating new system designs, true even in high-volume production because of flash memory's improved performance, flexibility and ability to be reprogrammed. Improved performance, life, and reliability have all been pivotal to the success of flash MCUs. For applications including computer peripherals, home appliances, and automotive uses, embedded flash is replacing ROM and one-time-programming (OTP) solutions by meeting the long-term stability and cost goals set by these well established technologies.

Flash MCUs are often crucial to product performance, yet as products gain expanded functionality and versatility, flash MCUs themselves are evolving into a more diverse device category, with faster speeds and higher generational turnover. In step with this evolution, manufacturers require high-speed, low-cost test solutions. Advantest's new T5782 offers the industry a flexible and cost-efficient answer to these needs.

Key Features

• Best-In-Class Test Speed
  Targeting the memory circuits of flash MCUs, the T5782 offers the fastest test speed in the industry: 266MHz. Parallel test capacity has been reduced by 50% compared to the previous model, the T5781, which optimizes the new tester's configuration to support rapid generational progress in the flash MCU segment, and allows for savings on specialized consumable fixturing costs and power consumption. Low running costs facilitate cost-effective flash MCU production.
• Comprehensive Memory Test Functionality
  Like the T5781, the T5782 also offers flash memory and DRAM test capabilities, enabling MCP (Multi Chip Package) test in addition to flash memory wafer and package test.
• Compatible With Previous Models
  The T5782 is compatible with the T5781 and the T5781ES (Engineering Station), a tester designed for lab use. Test programs developed on the T5781ES can be used for wafer test on the T5782, and for volume production on the T5781, making this trio of products a highly cost-effective test solution.

Key Specifications:

• Parallel Test Capacity: Up to 256 devices (X8bit IO / X9bit I/O, shared mode)
• Maximum Test Speed:66MHz / 533Mbps (DDR mode)
• Test Head: 1 station

SOURCE: Advantest Corporation