Products and Services
Standard Sample For In-Depth Profiling
This is a standard test sample with multilayer films for in-depth profiling of SIMS, AES, XPS and XRF.
This is a standard test sample with multilayer films for in-depth profiling of SIMS, AES, XPS and XRF. Suitable for evaluation of resolution, distance measurement and sensitivity.
Need More Information? Just Ask.
Click the button below to directly contact the supplier. Use it to:
- Ask a question.
- Request more detailed information or literature.
- Discuss your current project/application.
- Request a quote.
- Locate a distributor in your area.
- Schedule a demo.
