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Article: Test Structure Design For Parallel Testing

Keithley Instruments, Inc.

File Size: 1.52 MB   Estimated Download Time: < 1 min
Description

Parallel testing provides higher throughput than conventional sequential testing. Although parallel testing can sometimes be performed successfully on existing test structures, efficient test execution without signal loss generally requires attention to various test structure details. Frequently, optimizing the test structures for parallel test will increase throughput significantly and improve measurement integrity.

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