Cognex Introduces Next-Generation Wafer Reader

Natick, MA -- Cognex Corporation announced that it has expanded its family of wafer ID readers to include the In-Sight(r) 1721. Used for tracking semiconductor wafers through the manufacturing process, the In-Sight 1721 offers a slimmer package and twice the speed of its predecessors, yet maintains mounting and functional compatibility with them.

"As fabs move toward full wafer traceability, they are more dependent than ever on reliable automated wafer identification," said Justin Testa, Senior VP of ID Products for Cognex. "The In- Sight 1721, the newest member of Cognex's series of industry- leading wafer readers, reads faster with higher yield under difficult real world process conditions."

Advanced image formation technology and industry-leading OCR, 2D matrix, and barcode recognition algorithms enable the In-Sight 1721 to deliver reliable reading performance on SEMI-standard scribes. The 1721 also provides exceptionally high read rates on wafer marks that have been affected by CMP, edge beads, copper metallization, blue or green nitride coating, and other process effects.

The In-Sight 1721 offers flexible mounting options for easy installation on wafer sorters, ion implanters, probers and other tools. A graphical user interface simplifies set up, and automatic tuning minimizes operator intervention. Built-in network and serial communications provide connectivity to other process tools and the fab network.

The In-Sight 1721 will be available in September.

SOURCE: Cognex Corporation