Bookham New Focus Introduces New Technologies
The new fast actuator technology, being shown at the Bookham stand, offers submicron positional accuracy, complete speed and acceleration profile control, scan rates to 300mm/sec and projected lifetimes in UV applications of billions of cycles.
Based on actuator technology utilized in high reliability disk drives, New Focus is applying this technology to a wide range of applications, including precision scanning, shuttering, and apodization. Acceleration and deceleration profiles, as well as scan rates can be programmed and monitored in real time, all while maintaining submicron position control. Using low outgassing and UV friendly materials, while producing extremely low levels of vibration, this actuator technology is ready for use in a variety of lithographic and test applications.
Other demonstrations will feature New Focus active mounts with integrated Picomotor linear actuators and quad cell position detectors being used to achieve highly stable control of laser beam position. Of particular interest to the SCE market is the fact that all active elements used in this beam stabilization system are fully clean room compliant and can be used in conjunction with high intensity UV illumination.
"Bookham New Focus is continuing to push back the barriers of technology with its ongoing commitment to new products, designed to world-class levels of speed, performance and accuracy, and visitors to our stand will see for themselves the evidence of that commitment," said Nadim Maluf, Vice President of Marketing at Bookham New Focus.
"Our new products at SEMICON West are building on the success we have already experienced earlier in the year with customers who are finding that our expanded range is enabling them to solve complex and demanding test and measurement, research and other problems at the forefront of the photonics field," Maluf added.
Further new products on display at the Bookham New Focus stand include a range of Super Luminescent Diodes, specially designed with short coherence length for use in applications where spurious reflections caused by multiple reflective surfaces can compromise the accuracy of reflective measurements.
Bookham New Focus will be demonstrating this effect by comparing interference patterns generated with a conventional red (633nm) laser source and one of its own red SLDs. This exhibit will also demonstrate the stability of New Focus' optical mounts, tunable lasers and precision actuators.
SOURCE: Bookham, Inc.