Blade Probes w/ Metal or Ceramic Holders
Accuprobe offers a wide selection of metal blade profiles for semiconductor, hybrid circuit and laser trim applications. Blade probes are compatible with most probe card assembly machines and provide a stable and repairable solution for device test.
CERAMIC BLADE PROBES
Ceramic blades are also available for use in applications where critical signal levels require a probe with superior low noise characteristics. Stripline probes are also available for sensitive applications and are the perfect solution for mixed signal, RF and high-speed digital applications. Ceramic blades can be mixed with metal blades provided that blade profiles with the working depth are selected. Typical uses for mixed blades would be using the metal blades for power and ground and the ceramic blades for the critical signal measurements. Other mixed applications could apply metal blades connected to ground and located on both sides of a ceramic blade to serve as "guards" to reduce stray pickup.
Accuprobe, Inc, 1 Harrison Avenue, P.O. Box 1044, Salem, MA 10970. Tel: 978-745-7878; Fax: 978-745-7922.