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Title |
Abstract | Posted |
Size |
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| Research Report: Multiport RF Switch ICs and Modules | Multiport electrical switch IC/modules using InP HEMTs suitable for high-speed (10 or 40 Gbit/s) and micro-/millimeter-wave applications have been developed. The switches are classified as cold-FET switches, so they are analog switches with almost zero power dissipation. | 09/08/2008 | 891.4 KB |
| A Practical Guide For Establishing An RF Safety Program | The topic of RF safety is important to every organization that either uses RF and microwave energy to deliver an end product such as a wireless service or employs it to perform an industrial function such as packaging, cooking, and drying of materials or products. Narda Safety Test Solutions created this RF Safety Guide to provide the basic information needed to create an RF safety program. It is not intended to be a complete treatise on the subject, but rather an overview that covers the element of RF safety necessary to begin the implementation of an RF safety program | 04/22/2008 | 811.2 KB |
| Article: Influence Of Concentration And Fill Depth On Product Resistance Of Sucrose During Freeze Drying | Article: Influence Of Concentration And Fill Depth On Product Resistance Of Sucrose During Freeze Drying | 03/26/2008 | 174.6 KB |
| Brochure: Membrane CareSM Program | Siemens' Membrane Care Program provides comprehensive care for your Reverse Osmosis (RO)membrane system. In addition to maintaining a large inventory of stocked replacement membranes, we offer services for membrane removal, installation and on-site or off-site cleaning | 03/19/2008 | 512.3 KB |
| Video: VARI-CANT Jet Aeration | Our VARI-CANT® jet aeration systems utilize proven principles of jet aeration, combined with state-of-the-art design and materials, resulting in a system with superior performance, efficiency and trouble-free operation | 03/10/2008 | 16.74 MB |
| Article: The Impact Of TOC In UPW Systems For The Electronics Industry | During the past four decades the electronics industry has exponentially increased the number of circuits that are etched onto silicon chips. The increase in the number of circuits has significantly decreased the line-widths. Thereby, increasing by magnitudes the requirements for accurate and continuous measurement of the UPW system... | 03/04/2008 | 344.2 KB |
| FTIR Sampling Techniques | A choice on sampling technique exists for all types of sample. The chosen technique depends of the application and the sample states. The common techniques are described in detail as follows | 02/26/2008 | 38.0 KB |
| Fundamental Infrared Spectroscopy | White Paper: Fundamental Infrared Spectroscopy | 02/26/2008 | 126.4 KB |
| Fundamental Infrared Spectroscopy | White Paper: Fundamental Infrared Spectroscopy | 02/26/2008 | 126.4 KB |
| Validation Study Of FTIR-Based Emissions Measurements At A Municipal Waste Combustor | White Paper: Validation Study Of FTIR-Based Emissions Measurements At A Municipal Waste Combustor | 02/26/2008 | 178.8 KB |
| Making Your Own Reference Spectra, Method, And Determining Cell Pathlength Using AutoQuant 3.x | White Paper: Making Your Own Reference Spectra, Method, And Determining Cell Pathlength Using AutoQuant 3.x | 02/26/2008 | 274.4 KB |
| EPA Test Method 320 — Measurement Of Vapor Phase Organic And Inorganic Emissions By Extractive FTIR Spectroscopy | Persons unfamiliar with basic elements of FTIR spectroscopy should not attempt to use this method. This method describes sampling and analytical procedures for extractive emission measurements using Fourier transform infrared (FTIR) spectroscopy. Submitted by MIDAC Corporation |
02/25/2008 | 72.5 KB |
| Product Sheet: Large Capacity Glassware Washers | Product Sheet: Large Capacity Glassware Washers | 02/25/2008 | 275.2 KB |
| Product Sheet: Large Capacity Glassware Washer Accessories | Product Sheet: Large Capacity Glassware Washer Accessories | 02/25/2008 | 1.31 MB |
| Article: Test Structure Design For Parallel Testing | Parallel testing provides higher throughput than conventional sequential testing. Although parallel testing can sometimes be performed successfully on existing test structures, efficient test execution without signal loss generally requires attention to various test structure details. Frequently, optimizing the test structures for parallel test will increase throughput significantly and improve measurement integrity | 02/19/2008 | 1.52 MB |
| Datasheet: E10k™ Sonic Chlorinator | The Wallace & Tiernan® E10k unit is a vacuum operated, sonically regulated chlorinator. It provides for economic low capacity chlorine gas feed applications for municipal and industrial water and wastewater as well as industrial process water | 02/13/2008 | 150.4 KB |
| Article: Getting Started In Parallel Test -- Modification Of Existing Scribe Line TEGs | Wafer-level parallel parametric testing involves concurrent execution of multiple tests on multiple scribe line test structures. This has the potential for huge improvements in throughput with existing test hardware | 01/24/2008 | 863.7 KB |
| Brochure: Link2Site™ Cellular Based Pump Station Monitoring and Control System | The Link2Site cellular internet based monitoring and control system is a new and exciting way to control, monitor and enhance pumping station and lift station equipment and facilities | 12/20/2007 | 214.1 KB |
| Article: Implementation Of Wafer Level Parallel Test | Parallel parametric test is an emerging strategy for wafer-level testing that involves concurrent execution of multiple tests on multiple scribe line test structures. It offers a relatively inexpensive way to increase throughput, thereby lowering the cost of ownership (COO) significantly. Just as important, as device scaling increases the randomness of failures, parallel testing can address the growing need to perform more tests on the same structures in less time. In this case, users can choose to either increase the number of tests performed at each site, or increase the number of sites | 12/13/2007 | 255.5 KB |
| Datasheet: Forty-X™ Disc Filter | The Forty-X™ disc filter from Siemens Water Technologies is the ultimate barrier in tertiary filtration. It captures more solids in a smaller footprint with a pleated media design and has evolved to incorporate X-tra's that are important in woven cloth media filtration | 11/20/2007 | 75.4 KB |
| Brochure: Disc Filter | The disc filter from Siemens Water Technologies takes current tertiary filter disc technology to a new dimension by literally introducing a new wrinkle – pleated media | 11/20/2007 | 163.5 KB |
| Article: Parallel Parametric Measurements Reduce Test Costs | As the dimensions of modern integrated circuits continue to shrink, device fabrication and parametric testing have become more challenging. Every device shrink, process innovation, and new material makes the volume and repeatability of parametric test data more critical in process development and the control of modern fabs. Today’s fabs must understand how to produce and characterize advanced materials such as high-K gate dielectrics and low-K insulators used in conductive layers – quickly and cost-effectively. Tomorrow’s IC producers may need to manufacture and test transistors formed from carbon nanotubes or other technologies that researchers have just begun to explore. | 11/15/2007 | 210.6 KB |
| Product Brochure: SLA7800 Series: Metal Seal Flow Meters/Controllers | Product Brochure: SLA7800 Series: Metal Seal Flow Meters/Controllers | 11/14/2007 | 907.2 KB |
| Product Brochure: SLA7900 Series: UHP Metal Seal Flow Meters/Controllers | Product Brochure: SLA7900 Series: UHP Metal Seal Flow Meters/Controllers | 11/14/2007 | 870.2 KB |
| Application Note: Hard Disk Drive Development | Hard disk drives (HDD) with higher data density and faster access times rely heavily on the stability of the read-write head while flying over the magnetic media | 09/14/2007 | 1.80 MB |
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