Aehr Test Systems Ships First FOX-15 System

January 14, 2008

Fremont, CA - Aehr Test Systems recently announced it shipped the first FOX-15 wafer level burn-in system to a major automotive IC manufacturer during its second quarter of fiscal 2008. Revenue for this system will be recorded upon completion of customer acceptance.

"We are very excited to have achieved this major milestone of shipping the first FOX-15 system, which is designed to do parallel test and burn-in of up to 15 wafers that typically have longer test and burn-in times (measured in hours or days)," said Rhea Posedel, chairman and chief executive officer of Aehr Test Systems. "The FOX-15 system is a powerful addition to the FOX family of full wafer contact test and burn-in systems and is allowing us to broaden our customer base. With the introduction of the FOX-15, we now have systems and configurations available for test and burn-in of logic devices, DRAMs, Flash memories and VCSELs (laser diodes)."

For more information, please visit the Company's website at http://www.aehr.com.

SOURCE: Aehr Test Systems